Filesystem becomes read-only at random

Debian crashed on Laptop (Acer Aspire 3, about 4 years old, HDD replaced with ADATA SU650 240GB SSD) and started throwing console errors reading "failed to rotate /var/log/journal: read-only filesystem". It rebooted fine, but a while later refused to load websites and eventually crashed again. Right now, it's working fine. After a quick Google search I installed smartctl to figure out the problem, and though it prints an overall "PASSED", it does have some attributes output "Pre-failed" and I'm not exactly sure how to interpret the rest of the values. Here's the output: smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.0-37-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: ADATA SU650 Serial Number: 2N20292G46UJ LU WWN Device Id: 0 000000 000000000 Firmware Version: XD0R6305 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jun 29 21:36:52 2025 -03 SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 929 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1439 160 Uncorrectable_Error_Cnt 0x0032 100 100 050 Old_age Always - 0 161 Valid_Spare_Block_Cnt 0x0032 100 100 050 Old_age Always - 100 163 Initial_Bad_Block_Count 0x0032 100 100 000 Old_age Always - 48 164 Total_Erase_Count 0x0032 100 100 000 Old_age Always - 87382 165 Max_Erase_Count 0x0032 100 100 000 Old_age Always - 156 166 Min_Erase_Count 0x0032 100 100 000 Old_age Always - 44 167 Average_Erase_Count 0x0032 100 100 000 Old_age Always - 109 148 Total_SLC_Erase_Ct 0x0032 100 100 000 Old_age Always - 262148 149 Max_SLC_Erase_Ct 0x0032 100 100 000 Old_age Always - 468 150 Min_SLC_Erase_Ct 0x0032 100 100 000 Old_age Always - 132 151 Average_SLC_Erase_Ct 0x0032 100 100 000 Old_age Always - 329 159 DRAM_1_Bit_Error_Count 0x0032 100 100 000 Old_age Always - 0 168 Max_Erase_Count_of_Spec 0x0032 100 100 000 Old_age Always - 468 169 Remaining_Lifetime_Perc 0x0032 100 100 000 Old_age Always - 98 177 Wear_Leveling_Count 0x0032 100 100 000 Old_age Always - 1823 181 Program_Fail_Cnt_Total 0x0032 100 100 000 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 77 194 Temperature_Celsius 0x0032 100 100 000 Old_age Always - 26 195 Hardware_ECC_Recovered 0x0032 100 100 000 Old_age Always - 403177 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 232 Available_Reservd_Space 0x0032 100 100 000 Old_age Always - 100 241 Host_Writes_32MiB 0x0032 100 100 000 Old_age Always - 139845 242 Host_Reads_32MiB 0x0032 100 100 000 Old_age Always - 143114 245 TLC_Writes_32MiB 0x0032 100 100 000 Old_age Always - 296002 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. I'd greatly appreciate some advice on what these values mean and what can be done about them. I know that "Old_age" means the device is worn and "Pre-fail" means it's about to give, but I don't really know if this reflects normal wear, lack of maintenance, or is recoverable from. Thanks in advance!